We are delighted to extend an invitation to you for a special issue on "Radiation Protection in Modern Life" in collaboration with the Journal of Biomedical Physics and Engineering (JBPE). This special issue aims to enhance our understanding of radiation protection in various domains. We encourage you to submit your manuscript for consideration by March, 2024. Upon acceptance, all submitted manuscripts will be promptly published online after an objective review process.
By choosing JBPE as the publication venue for your research, you can benefit from the following advantages:
- Open access: JBPE is an open-access journal, ensuring unrestricted access to your published work.
- Enhanced visibility: Published articles in JBPE are indexed by PubMed and Scopus, which significantly increases their visibility and reach.
- Expedited publication: JBPE boasts a rapid publication process, ensuring swift dissemination of your research findings.
The special issue covers a broad range of topics related to radiation protection in modern life. While not limited to the following, some of the suggested areas of focus include:
- Artificial Intelligence (AI) in Radiation Protection
- Medical exposures to radiation in modern life
- Occupational radiation exposures
- Space Radiation
- Radiation exposures at aviation altitudes
- High Background radiation areas
- Nuclear Safety
Manuscripts that are submitted to this special issue will be promptly processed and made available online as soon as they are accepted. Furthermore, we are pleased to inform you that invited contributors to this special issue will receive a full waiver for all charges including article processing charges (APC) and any other associated fees. Other contributions will receive a partial waiver of APC and a full waiver of Fast track review (FTR) and fastest possible speed of publication fee. If you have any queries or would like to submit a manuscript, please do not hesitate to contact us. We are more than happy to assist you throughout the submission process.
We look forward to receiving your valuable contribution to this special issue. Thank you for considering this invitation.
Professor SMJ Mortazavi, Ph.D.; Professor James S Welsh, MD, Ph.D.; and Professor Lembit Sihver, Dr. of Techn. (Ph.D.), Lic. of Techn., M.Sc.